Orientation Determination of Cryo-EM Images Using Least Unsquared Deviations
نویسندگان
چکیده
A major challenge in single particle reconstruction from cryo-electron microscopy is to establish a reliable ab initio three-dimensional model using two-dimensional projection images with unknown orientations. Common-lines-based methods estimate the orientations without additional geometric information. However, such methods fail when the detection rate of common-lines is too low due to the high level of noise in the images. An approximation to the least squares global self-consistency error was obtained in [A. Singer and Y. Shkolnisky, SIAM J. Imaging Sci., 4 (2011), pp. 543-572] using convex relaxation by semidefinite programming. In this paper we introduce a more robust global self-consistency error and show that the corresponding optimization problem can be solved via semidefinite relaxation. In order to prevent artificial clustering of the estimated viewing directions, we further introduce a spectral norm term that is added as a constraint or as a regularization term to the relaxed minimization problem. The resulting problems are solved using either the alternating direction method of multipliers or an iteratively reweighted least squares procedure. Numerical experiments with both simulated and real images demonstrate that the proposed methods significantly reduce the orientation estimation error when the detection rate of common-lines is low.
منابع مشابه
Orientation Determination from Cryo-EM images Using Least Unsquared Deviation
A major challenge in single particle reconstruction from cryo-electron microscopy is to establish a reliable ab-initio three-dimensional model using two-dimensional projection images with unknown orientations. Common-lines based methods estimate the orientations without additional geometric information. However, such methods fail when the detection rate of common-lines is too low due to the hig...
متن کاملA graph theory method for determination of cryo-EM image focuses.
Accurate determination of micrograph focuses is essential for averaging multiple images to reach high-resolution 3-D reconstructions in electron cryo-microscopy (cryo-EM). Current methods use iterative fitting of focus-dependent simulated power spectra to the power spectra of experimental images, with the fitting performed independently for different images. Here we have developed a novel graph...
متن کاملSingle-particle cryo-EM using alignment by classification (ABC): the structure of Lumbricus terrestris haemoglobin
Single-particle cryogenic electron microscopy (cryo-EM) can now yield near-atomic resolution structures of biological complexes. However, the reference-based alignment algorithms commonly used in cryo-EM suffer from reference bias, limiting their applicability (also known as the 'Einstein from random noise' problem). Low-dose cryo-EM therefore requires robust and objective approaches to reveal ...
متن کاملViewing Direction Estimation in Cryo-EM Using Synchronization
A central task in recovering the structure of a macromolecule from cryo-electron microscopy (cryo-EM) images is to determine a three-dimensional model of the macromolecule given many of its two-dimensional projection images. The direction from each image taken the images which was is unknown, and are small and extremely noisy. The goal is to determine the direction from which each image was tak...
متن کاملUnsupervised Cryo-EM Data Clustering through Adaptively Constrained K-Means Algorithm
In single-particle cryo-electron microscopy (cryo-EM), K-means clustering algorithm is widely used in unsupervised 2D classification of projection images of biological macromolecules. 3D ab initio reconstruction requires accurate unsupervised classification in order to separate molecular projections of distinct orientations. Due to background noise in single-particle images and uncertainty of m...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- SIAM journal on imaging sciences
دوره 6 4 شماره
صفحات -
تاریخ انتشار 2013